Microwave Near-Field Imaging of Electric Fields in a Superconducting Microstrip Resonator

We describe the use of a cryogenic near-field scanning microwave microscope to image microwave electric fields from superconducting and normal-metal microstrip resonators. The microscope employs an open-ended coaxial probe and operates from 77 to 300 K in the 0.01-20 GHz frequency range with a spatial resolution of about 200 mm. We describe the operation of the system and present microwave images of Cu and Tl2Ba2CaCu2O8 microstrip resonators, showing standing wave patterns at the fundamental and second harmonic frequencies.Comment: 9 pages, 3 eps figure

On narrowing coated conductor film: emergence of granularity-induced field hysteresis of transport critical current

Critical current density Jc in polycrystalline or granular superconducting material is known to be hysteretic with applied field H due to the focusing of field within the boundary between adjacent grains. This is of concern in the so-called coated conductors wherein superconducting film is grown on a granular, but textured surface of a metal substrate. While previous work has mainly been on Jc determined using induced or magnetization currents, the present work utilizes transport current via an applied potential in strip geometry. It is observed that the effect is not as pronounced using transport current, probably due to a large difference in criterion voltage between the two types of measurements. However, when the films are narrowed by patterning into 200-, 100-, or 80-micron, the hysteresis is clearly seen, because of the forcing of percolation across higher-angle grain boundaries. This effect is compared for films grown on ion-beam-assisted-deposited (IBAD) YSZ substrate and those grown on rolling-assisted-biaxially-textures substrates (RABiTS) which have grains that are about ten times larger. The hysteresis is more pronounced for the latter, which is more likely to have a weak grain boundary spanning the width of the microbridge. This is also of concern to applications in which coated conductors will be striated in order to reduce of AC losses.Comment: text-only: 10 pages, plus 5 figures on 5 page

Frequency Following Imaging of Electric Fields from Resonant Superconducting Devices using a Scanning Near-Field Microwave Microscope

We have developed a scanning near-field microwave microscope that operates at cryogenic temperatures. Our system uses an open-ended coaxial probe with a 200 mm inner conductor diameter and operates from 77 to 300 K in the 0.01-20 GHz frequency range. In this paper, we present microwave images of the electric field distribution above a Tl2Ba2CaCu2O8 microstrip resonator at 77 K, measured at several heights. In addition, we describe the use of a frequency-following circuit to study the influence of the probe on the resonant frequency of the device.Comment: 4 pages, postscript file with 6 figures conference proceeding for the Applied Superconductivity Conference 199

Low Power Superconducting Microwave Applications and Microwave Microscopy

We briefly review some non-accelerator high-frequency applications of superconductors. These include the use of high-Tc superconductors in front-end band-pass filters in cellular telephone base stations, the High Temperature Superconductor Space Experiment, and high-speed digital electronics. We also present an overview of our work on a novel form of near-field scanning microscopy at microwave frequencies. This form of microscopy can be used to investigate the microwave properties of metals and dielectrics on length scales as small as 1 mm. With this microscope we have demonstrated quantitative imaging of sheet resistance and topography at microwave frequencies. An examination of the local microwave response of the surface of a heat-treated bulk Nb sample is also presented.Comment: 11 pages, including 6 figures. Presented at the Eight Workshop on RF Superconductivity. To appear in Particle Accelerator

Near-Field Scanning Microwave Microscopy: Measuring Local Microwave Properties and Electric Field Distributions

We describe the near-field microwave microscopy of microwave devices on a length scale much smaller than the wavelength used for imaging. Our microscope can be operated in two possible configurations, allowing a quantitative study of either material properties or local electric fields.Comment: 4 pages, 8 figures, minor corrections to text and 2 figure

Near-Field Microwave Microscopy of Materials Properties

Near-field microwave microscopy has created the opportunity for a new class of electrodynamics experiments of materials. Freed from the constraints of traditional microwave optics, experiments can be carried out at high spatial resolution over a broad frequency range. In addition, the measurements can be done quantitatively so that images of microwave materials properties can be created. We review the five major types of near-field microwave microscopes and discuss our own form of microscopy in detail. Quantitative images of microwave sheet resistance, dielectric constant, and dielectric tunability are presented and discussed. Future prospects for near-field measurements of microwave electrodynamic properties are also presented.Comment: 31 pages, 9 figures, lecture given at the 1999 NATO ASI on Microwave Superconductivity Changes suggested by editor, including full reference

Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope

We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 $\mu$m. The microscopes are capable of quantitative imaging of sheet resistance of thin films, and surface topography. We demonstrate the utility of the microscopes through images of the sheet resistance of a YBa2Cu3O7-d thin film wafer, images of bulk Nb surfaces, and spatially resolved measurements of Tc of a YBa2Cu3O7-d thin film. We also discuss some of the limitations of the microscope and conclude with a summary of its present capabilities.Comment: 6 pages with 9 figures, Proceedings of the Applied Superconductivity Conference 199